Two-functional µBIST for Testing and Self-Diagnosis of Analog Circuits in Electronic Embedded Systems
نویسندگان
چکیده
منابع مشابه
Fault Diagnosis of Fully Differential Circuits in Electronic Embedded Systems
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1 Gdansk University of Technology, Faculty of Electronics, Telecommunications and Informatics, Department of Metrology and Optoelectronics, ul. G. Narutowicza 11/12, 80-233 Gdansk, Poland, phone 48 58 347-14-87, fax 48 58 347-13-57, e-mail [email protected] 2 Gdansk University of Technology, Faculty of Electronics, Telecommunications and Informatics, Department of Metrology and Optoelectronics,...
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ژورنال
عنوان ژورنال: ACTA IMEKO
سال: 2014
ISSN: 2221-870X
DOI: 10.21014/acta_imeko.v3i4.150